Optimal Designs Of The Double Sampling X Chart Based On Parameter Estimation
Control charts, viewed as the most powerful and simplest tool in Statistical Process Control (SPC), are widely used in manufacturing and service industries. The double sampling (DS) X chart detects small to moderate process mean shifts effectively, while reduces the sample size. The convention...
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主要作者: | Teoh, Wei Lin |
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格式: | Thesis |
语言: | English |
出版: |
2013
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主题: | |
在线阅读: | http://eprints.usm.my/43833/1/Teoh%20Wei%20Lin24.pdf |
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