Fault Analysis And Test For Bridge Defect In Resistive Random Access Memory
Resistive Random-Access Memory (ReRAM) is one of the potential candidates of emerging semiconductor memory to replace the conventional memory technologies.Besides, ReRAM offers many attractive advantages, such as non-volatile, scalable, low power consumption, and fast data access. Due to the infancy...
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| Format: | Thesis |
| Language: | English English |
| Published: |
2016
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| Online Access: | http://eprints.utem.edu.my/id/eprint/18373/1/Fault%20Analysis%20And%20Test%20For%20Bridge%20Defect%20In%20Resistive%20Random%20Access%20Memory.pdf http://eprints.utem.edu.my/id/eprint/18373/2/Fault%20Analysis%20And%20Test%20For%20Bridge%20Defect%20In%20Resistive%20Random%20Access%20Memory.pdf |
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http://eprints.utem.edu.my/id/eprint/18373/1/Fault%20Analysis%20And%20Test%20For%20Bridge%20Defect%20In%20Resistive%20Random%20Access%20Memory.pdfhttp://eprints.utem.edu.my/id/eprint/18373/2/Fault%20Analysis%20And%20Test%20For%20Bridge%20Defect%20In%20Resistive%20Random%20Access%20Memory.pdf