Characterization and reliability investigatigation of eeprom tunnel oxide /

مواد مشابهة

• Tunneling in reliability study of MOS structures /
  بواسطة: Ma, Siguang
  منشور في: (1999)
• A study of CO/oxide/COFE tunneling junctions /
  بواسطة: Lim, Zao Lin
  منشور في: (2001)
• Instrumentation development of an automated integrated test system (AITS) for the characterization of hot-carrier and oxide reliability /
  بواسطة: Ng Tsu Hau
  منشور في: (2000)
• Fabrication and reliability study of ultrathin nitride/oxide gate stack and oxynitride /
  بواسطة: Lin, Wenhe
  منشور في: (2002)
• Static current and voltage techniques for CMOS reliability characterization /
  بواسطة: Jie, Bin Bin
  منشور في: (1999)