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Metal oxide semiconductors, Complementary
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Defectivity improvement in advanced processes and its investigation to negative bias temperature instabilities in High-K/Metal-Gate Deep-Submicron CMOS /
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Yasmin Abdul Wahab
Published 2015
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Process integration issues of self-aligned titanium silicide technology (Ti-Salicide) in deep sub-micron CMOS devices fabrication /
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Lim, Chong Wee
Published 1998
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Practical design of CMOS power devices and control with ESD safety in a linear battery charger IC /
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Khairi Omar
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Universiti Malaya
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Khairi Omar
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Yasmin Abdul Wahab
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