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  1. 1
    Modelling and simulation of hot-carrier degradation in submicrometre MOS transistors /
    由 Seah, Boon Pian
    出版 1995
    Thesis 图书
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  2. 2
    Characterization of hot-carrier degradation in submicrometer MOS transistors /
    由 Ang, Diing Shenp
    出版 1997
    Thesis 图书
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  3. 3
    A study of hot-carrier effects using photon emission spectroscopy /
    由 Tao, Jing Mei
    出版 1997
    Thesis 图书
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  4. 4
    Hot-carrier characterization of tungsten polycide gate and graded-junction MOS transistors /
    由 Lou, Choon Leong
    出版 1997
    Thesis 图书
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  5. 5
    Evaluation of hot-carrier degradation in submicrometre MOSFETs by gate capacitance and charge pumping current measurements /
    由 Tan, Suat Eng
    出版 1997
    Thesis 图书
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  6. 6
    Hot-carrier degradation study in MOSFET's by charge pumping, gated-diode and floating gate techniques /
    由 Goh, Yong Han
    出版 1997
    Thesis 图书
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  7. 7
    Lateral Diffused Metal Oxide Semiconductor (LDMOS) transistor Safe Operating Area (HCI-SOA) characterization under hot carrier injection /
    Thesis 图书
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  8. 8
    The lateral profiling of interface state and oxide charge densities in electrically stressed MOSFET's /
    由 Hoon, Siew Kuok
    出版 1998
    Thesis 图书
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  9. 9
    A study of hot-carrier degradation in nitrided and conventional oxides /
    由 Goo, Kah Heong
    出版 1998
    Thesis 图书
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  10. 10
    Hot-carrier effects in thin gate oxide MOSFET's /
    由 See, Leng Kian
    出版 1998
    Thesis 图书
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  11. 11
    Hot-carrier characterization of submicrometer MOS transistors : subthreshold degradation and channel-width effect /
    由 Qin, Wei Han
    出版 1998
    Thesis 图书
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  12. 12
    Hot-carrier studies in submicrometer SOI and conventional MOSFETs /
    由 Yip, Anselm
    出版 1998
    Thesis 图书
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  13. 13
    A study of hot carrier degradation in LDMOS transistor /
    由 Atikah Razi
    出版 2013
    Thesis 图书
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  14. 14
    Impact of fabrication process on hot carrier injection in VDMOS transistor /
    由 Murti, Wijaya Bayu
    出版 2013
    Thesis 图书
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  15. 15
    A study on hot carrier effect (HCE) on LDD n-MOSFET /
    由 Haziezol Helmi Mohd Yusof
    出版 2013
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