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  1. 1
    Characterization of hot-carrier degradation in submicrometer MOS transistors /
    by Ang, Diing Shenp
    Published 1997
    Thesis Book
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  2. 2
    A study of hot-carrier effects using photon emission spectroscopy /
    by Tao, Jing Mei
    Published 1997
    Thesis Book
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  3. 3
    Development of empirical potential profile model for unusual energy separation of subbands in inidium-absorbed Si(111) inversion layer /
    by Nur Idayu binti Ayob
    Published 2015
    Thesis
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  4. 4
    Extraction of submicron mosfet parameters /
    by Seah, Kah Suan
    Published 1997
    Thesis Book
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  5. 5
    Evaluation of hot-carrier degradation in submicrometre MOSFETs by gate capacitance and charge pumping current measurements /
    by Tan, Suat Eng
    Published 1997
    Thesis Book
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  6. 6
    New techniques for the characterization of hot-carrier degradation in MOS devices /
    by Leang, Sern Ee
    Published 1997
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  7. 7
    Analytic methods for timing analysis of interconnects in CMOS very large scale integrated circuits /
    by Yong, Alan Kuen Fatt
    Published 1997
    Thesis Book
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  8. 8
    Hot-carrier degradation study in MOSFET's by charge pumping, gated-diode and floating gate techniques /
    by Goh, Yong Han
    Published 1997
    Thesis Book
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  9. 9
    Characterization of pmosfet degradation in negative bias temperature instability test /
    by Soon, Foo Yew
    Published 2012
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  10. 10
    A study on the impact of processing parameters on low-voltage power MOSFET /
    by Nur Aqilah Othman
    Published 2012
    Thesis Book
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  11. 11
    Lateral Diffused Metal Oxide Semiconductor (LDMOS) transistor Safe Operating Area (HCI-SOA) characterization under hot carrier injection /
    Thesis Book
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  12. 12
    Two-dimensional analytical modelling of the short-channel mosfet /
    by Kendall, James D. 1959-
    Published 1987
    Thesis Book
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  13. 13
    Simulation of charge-trapping in nano-scale mosfets in the presence of random-dopants-induced variability /
    by Muhammad Faiz Bukhori
    Published 2011
    Thesis Book
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  14. 14
    Simulation framework of NBTI degradation in nano-scale p-mosfets from the perspective of hydrogen and non-hydrogen transport formalism /
    by Hanim Hussin
    Published 2015
    Thesis Book
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  15. 15
    Performance of advanced-process and multi-gated mosfets based on geometric and process design considerations /
    by Fazliyatul Azwa Md Rezali
    Published 2017
    Thesis Book
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  16. 16
    Degradation analysis based on design considerations of advanced-process MOSFET /
    by Ainul Fatin Muhammad Alimin
    Published 2018
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  17. 17
    The lateral profiling of interface state and oxide charge densities in electrically stressed MOSFET's /
    by Hoon, Siew Kuok
    Published 1998
    Thesis Book
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  18. 18
    A study of hot-carrier degradation in nitrided and conventional oxides /
    by Goo, Kah Heong
    Published 1998
    Thesis Book
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  19. 19
    Hot-carrier effects in thin gate oxide MOSFET's /
    by See, Leng Kian
    Published 1998
    Thesis Book
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  20. 20
    Hot-carrier characterization of submicrometer MOS transistors : subthreshold degradation and channel-width effect /
    by Qin, Wei Han
    Published 1998
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