Hot-carrier degradation study in MOSFET's by charge pumping, gated-diode and floating gate techniques /
Saved in:
| Main Author: | |
|---|---|
| Format: | Thesis Book |
| Language: | English |
| Published: |
1997.
|
| Subjects: | |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|